X-ray Diffraction

X-ray Diffraction (XRD) is a characterization technique used for examining the crystal structure of all materials. The instrument is a Bragg-Brentano geometry X-ray Diffractometer (XRD) with a cobalt X-ray source. It is ideal for qualitative phase identification, quantitative phase analysis and the determination of crystal structure. The cobalt source allows this instrument to accurately analyse high iron content samples. In addition to this, the instrument is equipped with a capillary stage for the measurement of a very small amount of sample. It is also useful for spinning samples that have issues due to high absorbances or texture effects.

Contact

Instrument Leader: Professor Sarah Harmer
XRD Facility Manager: Dr Alexander Sibley

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Instrument details and specifications

Bruker D8 Advance Eco X-ray diffractometer
Cobalt ka X-ray source
Diffrac EVA phase matching software with ICDD PDF 4+ elemental Database
TOPAS software package for Rietveld refinement.

Sample requirements

Samples should be powdered. Solid analysis is possible down to z heights of 1mm

Data analysis capabilities

Data analysis capabilities for XRD include the use of the ICDD PDF-2 Database, DIFFRAC. EVA Software for phase identification as well as the Topas software package (Rietveld refinement method) for crystal structure determination and quantitative phase analysis.