Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) uses a beam of electrons to image at a sub-micron resolution – much higher than is possible with an optical microscope. The electron beam interacts with the atoms in the sample and causes several different signals to be emitted. This allows High resolution SEM images to be combined with elemental mapping using Energy Dispersive X-ray spectroscopy (EDX) or with crystal grain orientation and boundary mapping using Electron Backscatter Diffraction (EBSD).

Contact

Instrument Leader: Professor Sarah Harmer
SEM Facility Manager: Dr Alexander Sibley

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Instrument details and specifications

FEI Inspect F50 Field Emission SEM

Secondary Electron detector
Backscatter Electron detector
Amated EDAX EDS detector
EDAX EBSD detector

Sample coating facility also available

Emitech K75X single Target sputter coater
Quorumtech Dual Target sputter Coater
Cressington 208HR Sputter coater
Cressington 208C carbon coater

Sample requirements

Samples must be solid, dry, conductive (facility available for surface coating). Sample size up to 100mm x and y, 40mm z

Application examples

^{SEM image of a steel particle on a polished steel surface. The grain structure of the steel can be seen in the background, while the particle itself has it’s own microstructure.}